Описание: High throughput of metals analysis requires optimization of sample introduction components and simple routine maintenance for success in the laboratory. This webinar will discuss the optimization of the six port valve system (ISIS3) and the utilization of HMI/UHMI to reduce the amount of periodic maintenance required to assure your ICP-MS is running for high throughput with precise results.
Лектор: L. Craig Jones, ICP-MS Application Scientist, Agilent Technologies, Inc.
Наличен запис по заявка
Първоначална дата: 29 януари 2021, 20:00 ч.
Продължителност: 1 час