Описание: As the needs of the semiconductor industry call for being able to measure metals at lower and lower concentrations, it is necessary to employ the best tune conditions for each of the metals of interest. This means that multiple tune modes such as cool plasma, hot plasma, oxygen, ammonia, etc are required when analyzing a full suite of elements thus necessitating the changing of RF power, positioning of the torch and gas flows within a single analysis. Not only is it important to demonstrate the ability to achieve low detection limits within these methods but also to demonstrate long term stability as the instrument cycles back and forth through the various tune conditions from sample to sample. We will show examples of this with TMAH and UPW matrices.
Лектори: Bert Woods, Application Scientist, Agilent Technologies, Inc.
Emmett Soffey, ICP-MS Product Specialist, Agilent Technologies, Inc.
Продължителност: 1 час
Дата: 5 октомври 2021, 22:30 ч.
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