Описание: Sample throughput can be one of the most challenging aspects of using a UV-VIS Spectrometer. Scanning spectrometers are capable of collecting data extremely quickly but overall, certain measurements, like kinetics and thermal melts, can still be bottlenecked by the need to measure one sample at a time. We will discuss in this webinar what to do in these scenarios - and how simultaneous data collection can speed up sample throughput and improve workflows.
Лектор: Scott Melis, PhD, Application Scientist, Agilent Technologies, Inc.
Продължителност: 40 минути
Дата: 3 октомври 2022, 22:30 ч. българско време