Demonstration of Trace Metals and Electronic Grade Materials Analysis Techniques and Strategies on live Instrumentation

12.10.2021 22:30

 

Описание: Agilent Applications Scientists will demonstrate on live 8900 Triple Quad ICPMS and 5900 ICPOES instrumentation, the hardware, MassHunter and ICP Expert software as well as tuning and cleanliness strategies used and recommended in semiconductor facilities to reduce contamination, maximize sensitivity and minimize interferences.

Лектори: Bert Woods, Application Scientist, Agilent Technologies, Inc.
Emmett Soffey, ICP-MS Product Specialist, Agilent Technologies, Inc.
Sima Singha, PhD, ICP-OES Application Scientist, Atomic Spectroscopy, Agilent Technologies, Inc.
Chris Conklin, Atomic Spectroscopy Product Specialist, Agilent Technologies, Inc.

Продължителност: 1 час

Дата: 12 октомври 2021, 22:30 ч. българско време

 

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