Описание: Learn how to automate method building using smart features of the ICP-OES. Run a quick scan of the sample using IntelliQuant and obtain sample insight and possible interferences without any calibration. Review your data like a pro with the new outlier flagging system and improve accuracy by selecting proper background and interference correction techniques.
Лектор: Greg Gilleland, Application Scientist, Agilent Technologies, Inc.
Дата: 6 ноември 2020, 20:00 ч.