Описание: The rare earth elements (REEs) consist of the 15 lanthanide elements, from lanthanum (La) to lutetium (Lu). Some lists of REEs also include scandium (Sc) and yttrium (Y) due to the similarity of their physical and chemical attributes. The unique properties of REEs make them critically important in defense, energy, and industrial applications. Current estimates indicate that China holds 30% of the world’s REE reserves [1] and, as of 2019, was responsible for about 90% of REE production worldwide [2]. Recent restrictions and interruptions of REE supply from China have drawn attention to the need for the US, and other countries, to develop their own supply chains to support industry and defense. [3]
Complex samples, such as REE ores, can result in complex backgrounds; however, with careful placement of background points, the off-peak technique can be used to correct the background. Interferences between REE elements and matrix materials can still be significant. To ensure the accuracy of this application, a combination of automated Fitted Background Correction (FBC), the Fast Automated Curve-Fitting Technique (FACT) spectral deconvolution algorithm, and off-peak background correction were used. In addition, a unique, synthetic IEC technique was used in cases where the above techniques were not suitable. Results of certified materials as well as real-world ore samples will be shown and discussed.
Лектор: Greg Gilleland, Application Scientist, Agilent Technologies, Inc.
Продължителност: 1 час
Дата: 25 януари 2022, 22:30 ч. българско време
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